Simulation study of lateral CEFT logic performance at 3 nm Node
Autor: | Wen, Guanguo, Long, Qiang, Shi, Xinlong, Wang, Ying, Liu, Feng, Hu, Huiyong, Zhang, Jincheng |
---|---|
Zdroj: | In Microelectronics Journal September 2023 139 |
Databáze: | ScienceDirect |
Externí odkaz: |