Measurement method of the IGBT chip temperature fluctuation based on electrothermal model derivation
Autor: | Li, Lie, He, Yigang, Du, Bolun |
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Zdroj: | In Microelectronics Journal December 2022 130 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Li, Lie, He, Yigang, Du, Bolun |
---|---|
Zdroj: | In Microelectronics Journal December 2022 130 |
Databáze: | ScienceDirect |
Externí odkaz: |