ASAP7: A 7-nm finFET predictive process design kit

Autor: Clark, Lawrence T., Vashishtha, Vinay, Shifren, Lucian, Gujja, Aditya, Sinha, Saurabh, Cline, Brian, Ramamurthy, Chandarasekaran, Yeric, Greg
Zdroj: In Microelectronics Journal July 2016 53:105-115
Databáze: ScienceDirect