Process variability-induced NoC link failure: A probabilistic model
| Autor: | Gawish, Eman Kamel, El-Kharashi, M. Watheq, Abu-Elyazeed, M.F. |
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| Zdroj: | In Microelectronics Journal March 2015 46(3):248-257 |
| Databáze: | ScienceDirect |
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| Autor: | Gawish, Eman Kamel, El-Kharashi, M. Watheq, Abu-Elyazeed, M.F. |
|---|---|
| Zdroj: | In Microelectronics Journal March 2015 46(3):248-257 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect