Sram cell stability metric under transient voltage noise
Autor: | Vătăjelu, Elena I., Gómez-Pau, Álvaro, Renovell, Michel, Figueras, Joan |
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Zdroj: | In Microelectronics Journal October 2014 45(10):1348-1353 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Vătăjelu, Elena I., Gómez-Pau, Álvaro, Renovell, Michel, Figueras, Joan |
---|---|
Zdroj: | In Microelectronics Journal October 2014 45(10):1348-1353 |
Databáze: | ScienceDirect |
Externí odkaz: |