A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC

Autor: Kerzérho, V., Bernard, S., Azaïs, F., Comte, M., Potin, O., Shan, C., Bontorin, G., Renovell, M.
Zdroj: In Microelectronics Journal September 2013 44(9):840-843
Databáze: ScienceDirect