A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC
Autor: | Kerzérho, V., Bernard, S., Azaïs, F., Comte, M., Potin, O., Shan, C., Bontorin, G., Renovell, M. |
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Zdroj: | In Microelectronics Journal September 2013 44(9):840-843 |
Databáze: | ScienceDirect |
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