Characterization method for thermal interface materials imitating an in-situ environment
| Autor: | Vass-Várnai, András, Sárkány, Zoltán, Rencz, Márta |
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| Zdroj: | In Microelectronics Journal September 2012 43(9):661-668 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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| Autor: | Vass-Várnai, András, Sárkány, Zoltán, Rencz, Márta |
|---|---|
| Zdroj: | In Microelectronics Journal September 2012 43(9):661-668 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
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Full Text from ScienceDirect