Non-linear thermal modeling of DMOS transistor and validation using electrical measurements and FEM simulations
Autor: | Košel, Vladimír, Illing, Robert, Glavanovics, Michael, Šatka, Alexander |
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Zdroj: | In Microelectronics Journal December 2010 41(12):889-896 |
Databáze: | ScienceDirect |
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