Macroscopic defects in GaN/AlN multiple quantum well structures grown by MBE on GaN templates
| Autor: | Andersson, T.G., Liu, X.Y., Aggerstam, T., Holmström, P., Lourdudoss, S., Thylen, L., Chen, Y.L., Hsieh, C.H., Lo, I. |
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| Zdroj: | In Microelectronics Journal February 2009 40(2):360-362 |
| Databáze: | ScienceDirect |
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