Thermal characterization of embedded electronic features by an integrated system of CCD thermography and self-adaptive numerical modeling
| Autor: | Raad, Peter E., Komarov, Pavel L., Burzo, Mihai G. |
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| Zdroj: | In Microelectronics Journal July 2008 39(7):1008-1015 |
| Databáze: | ScienceDirect |
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