Study on Mg memory effect in npn type AlGaN/GaN HBT structures grown by MOCVD

Autor: Ran, Junxue, Wang, Xiaoliang, Hu, Guoxin, Wang, Junxi, Li, Jianping, Wang, Cuimei, Zeng, Yiping, Li, Jinmin
Zdroj: In Microelectronics Journal July 2006 37(7):583-585
Databáze: ScienceDirect