Statistical analysis of topographic images of nanoporous silicon and model surfaces
| Autor: | da Silva, J.B., Jr., de Vasconcelos, E.A., dos Santos, B.E.C.A., Freire, J.A.K., Freire, V.N., Farias, G.A., da Silva, E.F., Jr. |
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| Zdroj: | In Microelectronics Journal November 2005 36(11):1011-1015 |
| Databáze: | ScienceDirect |
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