Direct electrical measurement of the electron g factor in ultra-thin InGaAs/InP single quantum wells
Autor: | Croke, E.T., Schwartz, R.N., Shi, B., Narayanan, A.A., Kiselev, A.A., Gyure, M.F. |
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Zdroj: | In Microelectronics Journal March-June 2005 36(3-6):379-382 |
Databáze: | ScienceDirect |
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