Direct electrical measurement of the electron g factor in ultra-thin InGaAs/InP single quantum wells

Autor: Croke, E.T., Schwartz, R.N., Shi, B., Narayanan, A.A., Kiselev, A.A., Gyure, M.F.
Zdroj: In Microelectronics Journal March-June 2005 36(3-6):379-382
Databáze: ScienceDirect