Transient thermo-reflectance measurements of the thermal conductivity and interface resistance of metallized natural and isotopically-pure silicon
| Autor: | Komarov, Pavel L., Burzo, Mihai G., Kaytaz, Gunhan, Raad, Peter E. ∗ |
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| Zdroj: | In Microelectronics Journal December 2003 34(12):1115-1118 |
| Databáze: | ScienceDirect |
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