Influence of the metallic absorption layer on the quality of thermal conductivity measurements by the transient thermo-reflectance method
Autor: | Burzo, Mihai G., Komarov, Pavel L., Raad, Peter E. ∗ |
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Zdroj: | In Microelectronics Journal 1 September 2002 33(9):697-703 |
Databáze: | ScienceDirect |
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