New approaches in the transient thermal measurements

Autor: Székely, V, Ress, S, Poppe, A, Török, S, Magyari, D, Benedek, Zs, Torki, K, Courtois, B, Rencz, M *
Zdroj: In Microelectronics Journal October 2000 31(9-10):727-733
Databáze: ScienceDirect