New approaches in the transient thermal measurements
Autor: | Székely, V, Ress, S, Poppe, A, Török, S, Magyari, D, Benedek, Zs, Torki, K, Courtois, B, Rencz, M * |
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Zdroj: | In Microelectronics Journal October 2000 31(9-10):727-733 |
Databáze: | ScienceDirect |
Externí odkaz: |