Effects of rapid thermal annealing in vacuum on electrical properties of thin Ta2O5–Si structures
Autor: | Spassov, D., Atanassova, E. *, Beshkov, G. |
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Zdroj: | In Microelectronics Journal August 2000 31(8):653-661 |
Databáze: | ScienceDirect |
Externí odkaz: |