Evaluation of the effect of six different paint cross section preparation methods on the performances of Fourier Transformed Infrared microscopy in attenuated total reflection mode

Autor: Prati, S., Rosi, F., Sciutto, G., Mazzeo, R., Magrini, D., Sotiropoulou, S., Van Bos, M.
Zdroj: In Microchemical Journal July 2012 103:79-89
Databáze: ScienceDirect