RBS, XRR and optical reflectivity measurements of Ti–TiO 2 thin films deposited by magnetron sputtering
| Autor: | Drogowska, K., Tarnawski, Z., Brudnik, A., Kusior, E., Sokołowski, M., Zakrzewska, K., Reszka, A., Kim-Ngan, N.- T.H., Balogh, A.G. |
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| Zdroj: | In Materials Research Bulletin 2012 47(2):296-301 |
| Databáze: | ScienceDirect |
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