Effect of annealing temperature on the microstructure and optical–electrical properties of Cu–Al–O thin films
| Autor: | Zhang, Y.J., Liu, Z.T., Zang, D.Y., Che, X.S., Feng, L.P., Bai, X.X. |
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| Zdroj: | In Journal of Physics and Chemistry of Solids December 2013 74(12):1672-1677 |
| Databáze: | ScienceDirect |
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