The effects of thermal annealing on the obliquely deposited Ag–Ge–S thin films

Autor: Wang, F., Dunn, W.P., Jain, M., De Leo, C., Vicker, N., Savage, R., Jin, X., Mamedov, S., Boolchand, P.
Zdroj: In Journal of Physics and Chemistry of Solids 2009 70(6):978-981
Databáze: ScienceDirect