Investigation of defect clusters in ion-irradiated Ni and NiCo using diffuse X-ray scattering and electron microscopy

Autor: Olsen, Raina J., Jin, Ke, Lu, Chenyang, Beland, Laurent K., Wang, Lumin, Bei, Hongbin, Specht, Eliot D., Larson, Bennett C.
Zdroj: In Journal of Nuclear Materials February 2016 469:153-161
Databáze: ScienceDirect