Investigation of defect clusters in ion-irradiated Ni and NiCo using diffuse X-ray scattering and electron microscopy
Autor: | Olsen, Raina J., Jin, Ke, Lu, Chenyang, Beland, Laurent K., Wang, Lumin, Bei, Hongbin, Specht, Eliot D., Larson, Bennett C. |
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Zdroj: | In Journal of Nuclear Materials February 2016 469:153-161 |
Databáze: | ScienceDirect |
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