Silicon displacement threshold energy determined by electron paramagnetic resonance and positron annihilation spectroscopy in cubic and hexagonal polytypes of silicon carbide

Autor: Kerbiriou, X., Barthe, M.-F., Esnouf, S., Desgardin, P., Blondiaux, G., Petite, G.
Zdroj: In Journal of Nuclear Materials 31 May 2007 362(2-3):202-207
Databáze: ScienceDirect