Silicon displacement threshold energy determined by electron paramagnetic resonance and positron annihilation spectroscopy in cubic and hexagonal polytypes of silicon carbide
Autor: | Kerbiriou, X., Barthe, M.-F., Esnouf, S., Desgardin, P., Blondiaux, G., Petite, G. |
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Zdroj: | In Journal of Nuclear Materials 31 May 2007 362(2-3):202-207 |
Databáze: | ScienceDirect |
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