Comparative study of microcrystalline silicon films prepared in low or high pressure regime by hot-wire chemical vapor deposition

Autor: Niikura, C, Guillet, J, Brenot, R, Equer, B, Bourée, J.E *, Voz, C, Peiro, D, Asensi, J.M, Bertomeu, J, Andreu, J
Zdroj: In Journal of Non-Crystalline Solids 2000 266 Part 1:385-390
Databáze: ScienceDirect