Structural analysis of RF sputtered Ge-Sb-Se thin films by Raman and X-ray photoelectron spectroscopies
| Autor: | Baudet, E., Cardinaud, C., Girard, A., Rinnert, E., Michel, K., Bureau, B., Nazabal, V. |
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| Zdroj: | In Journal of Non-Crystalline Solids 15 July 2016 444:64-72 |
| Databáze: | ScienceDirect |
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