Crystallinity of the mixed phase silicon thin films by Raman spectroscopy
| Autor: | Ledinský, M., Vetushka, A., Stuchlík, J., Mates, T., Fejfar, A., Kočka, J., Štěpánek, J. |
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| Zdroj: | In Journal of Non-Crystalline Solids 1 May 2008 354(19-25):2253-2257 |
| Databáze: | ScienceDirect |
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