Examination of local structure of composite and low dimension semiconductor with X-ray absorption spectroscopy

Autor: Lawniczak-Jablonska, K. a, ⁎, Demchenko, I.N. a, Piskorska, E. a, Wolska, A. a, Talik, E. b, Zakharov, D.N. c, Liliental-Weber, Z. c
Zdroj: In Journal of Non-Crystalline Solids 1 November 2006 352(40-41):4190-4199
Databáze: ScienceDirect