A simulation analysis of FIBL in decananometer Double-Gate MOSFETs with high- κ gate dielectrics

Autor: Autran, J.L., Munteanu, D., Bescond, M., Houssa, M., Said, A.
Zdroj: In Journal of Non-Crystalline Solids 2005 351(21):1897-1901
Databáze: ScienceDirect