Impact of in/ex situ annealing and reaction temperature on structural, optical and electrical properties of SnS thin films
Autor: | Olgar, M.A., Çiriş, A., Tomakin, M., Zan, R. |
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Zdroj: | In Journal of Molecular Structure 5 October 2021 1241 |
Databáze: | ScienceDirect |
Externí odkaz: |