Investigation of sidewall damage induced by reactive ion etching on AlGaInP MESA for micro-LED application

Autor: Boussadi, Younes, Rochat, Névine, Barnes, Jean-Paul, Bakir, Badhise Ben, Ferrandis, Philippe, Masenelli, Bruno, Licitra, Christophe
Zdroj: In Journal of Luminescence June 2021 234
Databáze: ScienceDirect