Life prediction of OLED for constant-stress accelerated degradation tests using luminance decaying model
Autor: | Zhang, Jianping, Li, Wenbin, Cheng, Guoliang, Chen, Xiao, Wu, Helen, Herman Shen, M.-H. |
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Zdroj: | In Journal of Luminescence October 2014 154:491-495 |
Databáze: | ScienceDirect |
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