Life prediction of OLED for constant-stress accelerated degradation tests using luminance decaying model

Autor: Zhang, Jianping, Li, Wenbin, Cheng, Guoliang, Chen, Xiao, Wu, Helen, Herman Shen, M.-H.
Zdroj: In Journal of Luminescence October 2014 154:491-495
Databáze: ScienceDirect