Structural imaging of a Si quantum dot: Towards combined PL and TEM characterization
| Autor: | Sychugov, I., Lu, J., Elfström, N., Linnros, J. |
|---|---|
| Zdroj: | In Journal of Luminescence 2006 121(2):353-355 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
| Autor: | Sychugov, I., Lu, J., Elfström, N., Linnros, J. |
|---|---|
| Zdroj: | In Journal of Luminescence 2006 121(2):353-355 |
| Databáze: | ScienceDirect |
| Externí odkaz: |
|
Full Text from ScienceDirect