High resolution surface analysis of Si roughening in dilute ammonium fluoride solution

Autor:	Lewerenz, H.J *, Aggour, M, Murrell, C, Jakubowicz, J, Kanis, M, Campbell, S.A, Cox, P.A, Hoffmann, P, Jungblut, H, Schmeißer, D
Zdroj:	In Journal of Electroanalytical Chemistry 2003 540:3-6
Databáze:	ScienceDirect
Externí odkaz:	Zobrazit plný text záznamu Full Text from ScienceDirect