Low-temperature deposition of Si and SiO 2 thin-film layers in an ultrahigh vacuum system

Autor: Ohtsuka, K *, Yoshida, T, Oizumi, T, Murai, A, Kurabayashi, T, Nishizawa, J
Zdroj: In Journal of Crystal Growth 2000 209(2):331-334
Databáze: ScienceDirect