In situ optical monitoring for SiGe epitaxy
Autor: | Robbins, D.J *, Pickering, C, Russell, J, Carline, R.T, Dann, A.W, Marrs, A.D, Glasper, J.L |
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Zdroj: | In Journal of Crystal Growth 2000 209(2):290-296 |
Databáze: | ScienceDirect |
Externí odkaz: |
Autor: | Robbins, D.J *, Pickering, C, Russell, J, Carline, R.T, Dann, A.W, Marrs, A.D, Glasper, J.L |
---|---|
Zdroj: | In Journal of Crystal Growth 2000 209(2):290-296 |
Databáze: | ScienceDirect |
Externí odkaz: |