Normally-Off Metal-Insulator-Semiconductor P-GaN gated AlGaN/GaN high electron mobility transistors with low gate leakage current

Autor: Du, Jiyao, Pu, Taofei, Li, Xiaobo, Li, Liuan, Ao, Jin-Ping, Gao, Hongwei
Zdroj: In Journal of Crystal Growth 1 June 2023 611
Databáze: ScienceDirect