Effects of constant voltage stress on bipolar degradation in 4H-SiC IGBT

Autor: An, Yunlai, Zhang, Wenting, Tang, Xinling, Niu, Xiping, Wang, Liang, Yang, Xiaolei, Shen, Zhanwei, Sun, Junmin, Sang, Ling, Liu, Rui, Du, Zechen, Luo, Weixia, Li, Ling, Chen, Zhongyuan, Wei, Xiaoguang, Yang, Fei
Zdroj: In Journal of Crystal Growth 1 March 2023 605
Databáze: ScienceDirect