Synchrotron X-ray topographic characterization of dislocations in 6H-SiC axial samples
| Autor: | Peng, Hongyu, Liu, Yafei, Chen, Zeyu, Cheng, Qianyu, Hu, Shanshan, Raghothamachar, Balaji, Dudley, Michael, Sampayan, Kristin, Sampayan, Stephen |
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| Zdroj: | In Journal of Crystal Growth 1 February 2022 579 |
| Databáze: | ScienceDirect |
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