Spectroscopic ellipsometry as an in-situ monitoring tool for Bi2Se3 films grown by molecular beam epitaxy
| Autor: | Hilse, Maria, Wang, Xiaoyu, Killea, Phoebe, Peiris, Frank, Engel-Herbert, Roman |
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| Zdroj: | In Journal of Crystal Growth 15 July 2021 566-567 |
| Databáze: | ScienceDirect |
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