Measurement and evaluation of the defects in Cd1−xZnxTe materials by observing their etch pits in real time
| Autor: | Yu, H.X., Yang, J.R., Zhang, J.J., Xu, C., Sun, S.W., Zhou, C.H. |
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| Zdroj: | In Journal of Crystal Growth 15 January 2019 506:1-7 |
| Databáze: | ScienceDirect |
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