Spatial distribution of structural defects in Cz-seeded directionally solidified silicon ingots: An etch pit study
Autor: | Lantreibecq, A., Legros, M., Plassat, N., Monchoux, J.P., Pihan, E. |
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Zdroj: | In Journal of Crystal Growth 1 February 2018 483:183-189 |
Databáze: | ScienceDirect |
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