Suppression of electron overflow in 370-nm InGaN/AlGaN ultraviolet light emitting diodes with different insertion layer thicknesses

Autor: Wang, C.K., Wang, Y.W., Chiou, Y.Z., Chang, S.H., Jheng, J.S., Chang, S.P., Chang, S.J.
Zdroj: In Journal of Crystal Growth 15 June 2017 468:585-589
Databáze: ScienceDirect