Real-time measurement of substrate temperature in molecular beam epitaxy using low-coherence tandem interferometry
| Autor: | Yurasov, D.V., Luk׳yanov, A.Yu., Volkov, P.V., Goryunov, A.V., Tertyshnik, A.D., Drozdov, M.N., Novikov, A.V. |
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| Zdroj: | In Journal of Crystal Growth 1 March 2015 413:42-45 |
| Databáze: | ScienceDirect |
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