Structural properties of Si-doped β-Ga2O3 layers grown by MOVPE

Autor: Gogova, D., Wagner, G., Baldini, M., Schmidbauer, M., Irmscher, K., Schewski, R., Galazka, Z., Albrecht, M., Fornari, R.
Zdroj: In Journal of Crystal Growth 1 September 2014 401:665-669
Databáze: ScienceDirect