Behavior of defects in a-plane GaN films grown by low-angle-incidence microchannel epitaxy (LAIMCE)

Autor: Kuwano, Noriyuki, Ryu, Yuki, Mitsuhara, Masatoshi, Lin, Chia-Hung, Uchiyama, Shota, Maruyama, Takahiro, Suzuki, Yohei, Naritsuka, Shigeya
Zdroj: In Journal of Crystal Growth 1 September 2014 401:409-413
Databáze: ScienceDirect