Material characterization of high Sn-content, compressively-strained GeSn epitaxial films after rapid thermal processing

Autor: Chen, Robert, Huang, Yi-Chiau, Gupta, Suyog, Lin, Angie C., Sanchez, Errol, Kim, Yihwan, Saraswat, Krishna C., Kamins, Theodore I., Harris, James S.
Zdroj: In Journal of Crystal Growth 15 February 2013 365:29-34
Databáze: ScienceDirect