X-ray diffraction analysis of step-graded InxGa1−xAs buffer layers grown by molecular beam epitaxy
| Autor: | Lin, Hai, Huo, Yijie, Rong, Yiwen, Chen, Robert, Kamins, Theodore I., Harris, James S. |
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| Zdroj: | In Journal of Crystal Growth 15 May 2011 323(1):17-20 |
| Databáze: | ScienceDirect |
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