Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging
| Autor: | Danilewsky, A.N. a, ⁎, Wittge, J. a, Croell, A. a, Allen, D. b, McNally, P. b, Vagovič, P. c, d, dos Santos Rolo, T. c, Li, Z. c, Baumbach, T. c, Gorostegui-Colinas, E. e, Garagorri, J. e, Elizalde, M.R. e, Fossati, M.C. f, Bowen, D.K. f, Tanner, B.K. f |
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| Zdroj: | In Journal of Crystal Growth 1 March 2011 318(1):1157-1163 |
| Databáze: | ScienceDirect |
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