Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging
| Autor: | Danilewsky, A.N., Wittge, J., Croell, A., Allen, D., McNally, P., Vagovič, P., dos Santos Rolo, T., Li, Z., Baumbach, T., Gorostegui-Colinas, E., Garagorri, J., Elizalde, M.R., Fossati, M.C., Bowen, D.K., Tanner, B.K. |
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| Zdroj: | In Journal of Crystal Growth 1 March 2011 318(1):1157-1163 |
| Databáze: | ScienceDirect |
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