Strain engineering in GaN layers grown on silicon by molecular beam epitaxy: The critical role of growth temperature

Autor: Cordier, Y., Baron, N., Chenot, S., Vennéguès, P., Tottereau, O., Leroux, M., Semond, F., Massies, J.
Zdroj: In Journal of Crystal Growth 2009 311(7):2002-2005
Databáze: ScienceDirect